| 2013 | ETS | Current testing: Dead or alive? | Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello |
| 2013 | ETS | Semiconductor failure modes and mitigation for critical systems embedded tutorial. | Hans A. R. Manhaeve, Esko Mikkola |
| 2008 | DATE | Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality. | B. Straka, Hans A. R. Manhaeve, J. Brenkus, Stefaan Kerckenaere |
| 2008 | DDECS | The Quest for Test: Will Redundancy Cover All? | Hans A. R. Manhaeve |
| 2003 | ETS | A practical evaluation of I | Alessandra Fudoli, Alberto Ascagni, Davide Appello, Hans A. R. Manhaeve |
| 2002 | ETS | A real world application used to implement a true IDDQ based test strategy (facts and figures). | Hans A. R. Manhaeve, Joseph S. Vaccaro, Loren Benecke, David Prystasz |
| 1999 | DATE | On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC. | Viera Stopjakov, Hans A. R. Manhaeve, M. Sidiropulos |
| 1999 | ETS | Application of supply current testing to analogue circuits, towards a structural analogue test methodology. | Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil |
| 1998 | DATE | A Fully Digital Controlled Off-Chip IDDQ Measurement Unit. | B. Straka, Hans A. R. Manhaeve, Jozef Vanneuville, M. Svajda |
| 1998 | DATE | IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit. | M. Svajda, B. Straka, Hans A. R. Manhaeve |
| 1997 | DATE | CCII+ current conveyor based BIC monitor for I | Viera Stopjakov, Hans A. R. Manhaeve |
| 1997 | DATE | A monolithic off-chip IDDQ monitor. | M. Svajda, B. Straka, Hans A. R. Manhaeve |
| 1994 | ITC | An Off-chip I | Hans A. R. Manhaeve, Paul L. Wrighton, Jos van Sas, Urbain Swerts |