Hari Balachandran
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
11
Venues
2
Active years
1996–2004
Best venue rank
A
Where they publish
Papers
11 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2004 | ITC | K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits. | Wangqi Qiu, Jing Wang, D. M. H. Walker, Divya Reddy, Zhuo Li, Weiping Shi, Hari Balachandran |
| 2002 | ITC | Facilitating Rapid First Silicon Debug. | Hari Balachandran, Kenneth M. Butler, Neil Simpson |
| 2000 | ITC | Logic mapping on a microprocessor. | Anjali Kinra, Hari Balachandran, Regy Thomas, John Carulli |
| 2000 | ITC | Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. | Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler |
| 2000 | VTS | Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. | Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana |
| 1999 | ITC | Expediting ramp-to-volume production. | Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala |
| 1999 | ITC | Correlation of logical failures to a suspect process step. | Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith |
| 1999 | ITC | Clustering based techniques for I_DDQ testing. | Sri Jandhyala, Hari Balachandran, Anura P. Jayasumana |
| 1999 | VTS | REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. | Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer |
| 1998 | ITC | On applying non-classical defect models to automated diagnosis. | Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess |
| 1996 | VTS | Improvement of SRAM-based failure analysis using calibrated Iddq testing. | Hari Balachandran, D. M. H. Walker |