Hironobu Niijima
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
1
Active years
1988–1996
Best venue rank
A
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1996 | ITC | Scan Design Oriented Test Technique for VLSI's Using ATE. | Yasuji Oyama, Toshinobu Kanai, Hironobu Niijima |
| 1993 | ITC | CAD-Driven High-Precision E-Beam Positioning. | Kent Kwang, Hsin Wang, Arthur Hu, Mitsuyuki Asaki, Hironobu Niijima |
| 1990 | ITC | New approach to integrate LSI design databases with e-beam tester. | Arthur Hu, Hironobu Niijima |
| 1988 | ITC | Electron Beam Tester Integrated into a VLSI Tester. | Hironobu Niijima, Yasuo Tokunaga, Shouichi Koshizuka, Kazuo Yakuwa, Pter Fazekas, Mathias Sturm, Hans-Peter Feuerbaum |