Hong Kim
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2007–2012
Best venue rank
National
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2012 | VTS | Write-through method for embedded memory with compression Scan-based testing. | Geewhun Seok, Hong Kim, Baker Mohammad |
| 2007 | ITC | Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip. | Robert F. Molyneaux, Thomas A. Ziaja, Hong Kim, Shahryar Aryani, Sungbae Hwang, Alex Hsieh |