| 2018 | ISCAS | Bistability in a CMOS-MEMS Thermally Tuned Microbeam Resonator. | Joan Barcel, Ivan de Pal, Sebasti A. Bota, Jaume Segura, Jaume Verd |
| 2013 | IOLTS | Accurate alpha soft error rate evaluation in SRAM memories. | Sebasti A. Bota, Gabriel Torrens, Ivan de Pal, Bartomeu Alorda, L. A. Segura |
| 2009 | ICANN | Spiking Neural Network Self-configuration for Temporal Pattern Recognition Analysis. | Jos Luis Rossell, Ivan de Pal, Vincent Canals, Antoni Morro |
| 2009 | ISNN | Practical Hardware Implementation of Self-configuring Neural Networks. | Jos Luis Rossell, Vincent Canals, Antoni Morro, Ivan de Pal |
| 2008 | IJCNN | Using stochastic logic for efficient pattern recognition analysis. | Jos Luis Rossell, Vincent Canals, Ivan de Pal, Jaume Segura |
| 2006 | IJCNN | A Fully CMOS Low-Cost Chaotic Neural Network. | Jos Luis Rossell, Sebasti A. Bota, Vicent Canals, Ivan de Pal, Jaume Segura |
| 2004 | IOLTS | A BIST-based Charge Analysis for Embedded Memories. | Bartomeu Alorda, Vicent Canals, Ivan de Pal, Jaume Segura |
| 2001 | VTS | Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. | Ivan de Pal, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden |
| 2000 | IOLTS | On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor. | Bartomeu Alorda, Ivan de Pal, Jaume Segura, T. Miller |