Ivo Schanstra
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
3
Active years
1994–2003
Best venue rank
A
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | DATE | Consequences of RAM Bitline Twisting for Test Coverage. | Ivo Schanstra, Ad J. van de Goor |
| 1999 | ITC | Industrial evaluation of stress combinations for march tests applied to SRAMs. | Ad J. van de Goor, Ivo Schanstra |
| 1998 | ITC | Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. | Ivo Schanstra, Dharmajaya Lukita, Ad J. van de Goor, Kees Veelenturf, Paul J. van Wijnen |
| 1996 | DATE | Towards a Uniform Notation for Memory Tests. | Ad J. van de Goor, Aad Offerman, Ivo Schanstra |
| 1995 | DATE | Functional test for shifting-type FIFOs. | Ad J. van de Goor, Ivo Schanstra, Yervant Zorian |
| 1994 | ITC | An Effective BIST Scheme for Ring-Address Type FIFOs. | Yervant Zorian, Ad J. van de Goor, Ivo Schanstra |
| 1994 | VTS | Fault models and tests for Ring Address Type FIFOs. | Ad J. van de Goor, Ivo Schanstra, Yervant Zorian |