J. Th. van der Linden
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
10
Venues
3
Active years
1993–2002
Best venue rank
A
Where they publish
Papers
10 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2002 | ITC | Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume. | M. J. Geuzebroek, J. Th. van der Linden, Ad J. van de Goor |
| 2000 | ITC | Test point insertion for compact test sets. | M. J. Geuzebroek, J. Th. van der Linden, Ad J. van de Goor |
| 1999 | DATE | Illegal State Space Identification for Sequential Circuit Test Generation. | M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor |
| 1999 | ITC | Testability of the Philips 80C51 micro-controller. | M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor |
| 1997 | ITC | Sequential Test Generation with Advanced Illegal State Search. | M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor |
| 1996 | ITC | Accelerated Compact Test Set Generation for Three-State Circuits. | M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor |
| 1995 | VTS | Compact test sets for industrial circuits. | M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor |
| 1994 | ITC | Parallel Pattern Fast Fault Simulation for Three-State Circuits and Bidirectional I/O. | J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor |
| 1994 | VTS | Test generation and three-state elements, buses, and bidirectionals. | J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor |
| 1993 | ITC | Test Pattern Generation with Restrictors. | M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor |