| 2001 | ITC | Power supply transient signal integration circuit. | Chintan Patel, Fidel Muradali, James F. Plusquellic |
| 2001 | ITC | Detecting delay faults using power supply transient signal analysis. | Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker |
| 2000 | ITC | Predicting device performance from pass/fail transient signal analysis data. | James F. Plusquellic, Amy Germida, Jonathan Hudson, Ernesto Staroswiecki, Chintan Patel |
| 2000 | VTS | Detection of CMOS Defects under Variable Processing Conditions. | Amy Germida, James F. Plusquellic |
| 1999 | ITC | Defect detection using power supply transient signal analysis. | Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali |
| 1997 | ITC | Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data. | James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan |
| 1996 | ITC | Digital Integrated Circuit Testing using Transient Signal Analysis. | James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan |