John E. McDermid
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
2
Active years
1993–1998
Best venue rank
A
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1998 | ITC | Limited access testing: IEEE 1149.4-instrumentation and methods. | John E. McDermid |
| 1997 | ITC | Design, Fabrications and Use of Mixed-Signal IC Testability Structures. | Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa |
| 1997 | VTS | Will 0.1um Digital Circuits Require Mixed-Signal Testing. | Melvin A. Breuer, Bozena Kaminska, John E. McDermid, V. Rayapathi, Donald L. Wheater |
| 1993 | ITC | Structure and Metrology for an Analog Testability Bus. | Kenneth P. Parker, John E. McDermid, Stig Oresjo |