Jonathan T.-Y. Chang
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
6
Venues
2
Active years
1996–1998
Best venue rank
A
Where they publish
Papers
6 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1998 | ITC | Detecting resistive shorts for CMOS domino circuits. | Jonathan T.-Y. Chang, Edward J. McCluskey |
| 1998 | ITC | Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. | Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
| 1998 | VTS | Experimental Results for IDDQ and VLV Testing. | Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey |
| 1997 | VTS | SHOrt voltage elevation (SHOVE) test for weak CMOS ICs. | Jonathan T.-Y. Chang, Edward J. McCluskey |
| 1996 | ITC | Detecting Delay Flaws by Very-Low-Voltage Testing. | Jonathan T.-Y. Chang, Edward J. McCluskey |
| 1996 | VTS | Quantitative analysis of very-low-voltage testing. | Jonathan T.-Y. Chang, Edward J. McCluskey |