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Julia Lefevre

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

3

Venues

2

Active years

2021–2023

Best venue rank

A

Where they publish

Papers

3 indexed papers, newest first.

YearVenueTitleAuthors
2023ITCPredictor BIST: An "All-in-One" Optical Test Solution for CMOS Image Sensors.Julia Lefevre, P. Debaud, Patrick Girard, Arnaud Virazel
2022ETSA Generic Fast and Low Cost BIST Solution for CMOS Image Sensors.Julia Lefevre, P. Debaud, Patrick Girard, Arnaud Virazel
2021ITCA Fast and Low Cost Embedded Test Solution for CMOS Image Sensors.Julia Lefevre, Philippe Debaud, Patrick Girard, Arnaud Virazel