| 2026 | IOLTS | Impact of Locations of Circuit Components on Multiple Cell Upset Mitigation in a 22 nm Bulk Process. | Shuhei Mandai, Ryuichi Nakajima, Arata Matsumoto, Yusaku Nakaoka, Hikaru Nakamoto, Sotaro Taniguchi, Shinobu Onoda, Jun Furuta, Kazutoshi Kobayashi |
| 2025 | IOLTS | Comparative Analysis of TID Effects in a 65 nm FD-SOI Process Under Gamma-Ray and Alpha-Ray Irradiation. | Hikaru Nakamoto, Taiki Ozawa, Ryuichi Nakajima, Haruto Sugisaki, Keita Yoshida, Jun Furuta, Kazutoshi Kobayashi |
| 2023 | IOLTS | Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation. | Shotaro Sugitani, Ryuichi Nakajima, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard |
| 2022 | IOLTS | Radiation Hardened Flip-Flops Minimizing Area, Power, and Delay Overheads with 1/100 Lower α-SER in a 130 nm Bulk Process. | Ryuichi Nakajima, Kazuya Ioki, Jun Furuta, Kazutoshi Kobayashi |
| 2019 | IOLTS | Comparison of Radiation Hardness of Stacked Transmission-Gate Flip Flop and Stacked Tristate-Inverter Flip Flop in a 65 nm Thin BOX FDSOI Process. | Mitsunori Ebara, Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi |
| 2019 | IOLTS | Total Ionizing Dose Effects by alpha irradiation on circuit performance and SEU tolerance in thin BOX FDSOI process. | Takashi Yoshida, Kazutoshi Kobayashi, Jun Furuta |
| 2011 | ASPDAC | A 65nm flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles. | Jun Furuta, Chikara Hamanaka, Kazutoshi Kobayashi, Hidetoshi Onodera |