Juney Park
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1991–1991
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1991 | VTS | An analysis and testing of operation induced faults in MOS VLSI. | Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya, Juney Park |