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Karim Arabi

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

27

Venues

8

Active years

1994–2023

Best venue rank

National

Where they publish

Papers

27 indexed papers, newest first.

YearVenueTitleAuthors
2023RANLPExploring the Landscape of Natural Language Processing Research.Tim Schopf, Karim Arabi, Florian Matthes
2021VTSEdge Computing Trends, Design and Test Challenges - Keynote.Karim Arabi
2015ITCBrain-inspired computing.Karim Arabi
2014ISLPEDLow power design techniques in mobile processes.Karim Arabi
2011VTSLeakage power profiling and leakage power reduction using DFT hardware.Rajamani Sethuram, Karim Arabi, Mohamed H. Abu-Rahma
2010VTSSpecial session 6C: New topic mixed-signal test impact to SoC commercialization.Karim Arabi
2010VTSPower noise and its impact on production test and validation of SoC devices.Karim Arabi
2007ISCASA Novel Active Decoupling Capacitor Design in 90nm CMOS.Xiongfei Meng, Karim Arabi, Resve A. Saleh
2004ISCASMixed RL-Huffman encoding for power reduction and data compression in scan test.Mohammad H. Tehranipour, Mehrdad Nourani, Karim Arabi, Ali Afzali-Kusha
2003ICCADMixed Signal DFT: A Concise Overview.Bozena Kaminska, Karim Arabi
2003ITCOverview of the IEEE P1500 Standard.Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur
2002ITCMixed-Signal BIST: Fact or Fiction.Karim Arabi
2002VTSLogic BIST and Scan Test Techniques for Multiple Identical Blocks.Karim Arabi
2002VTSMulti-GigaHertz Testing Challenges and Solutions.Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei
1998ICCDTesting digital to analog converters based on oscillation-test strategy using sigma-delta modulation.Hassan Ihs, Karim Arabi, Bozena Kaminska
1998ITCDigital oscillation-test method for delay and stuck-at fault testing of digital circuits.Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska
1997DATEEfficient and accurate testing of analog-to-digital converters using oscillation-test method.Karim Arabi, Bozena Kaminska
1997ICCDBuilt-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures.Karim Arabi, Bozena Kaminska
1997ITCDesign and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and IKarim Arabi, Bozena Kaminska
1997ITCOscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits.Karim Arabi, Bozena Kaminska
1997ITCAnalog and Mixed-Signal Benchmark Circuits-First Release.Bozena Kaminska, Karim Arabi, I. Bell, Jos L. Huertas, Bruce C. Kim, Adoracin Rueda, Mani Soma, Prashant Goteti
1997VTSParametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology.Karim Arabi, Bozena Kaminska
1996ICCDDesign for testability of integrated operational amplifiers using oscillation-test strategy.Karim Arabi, Bozena Kaminska, Stephen K. Sunter
1996VTSOscillation-test strategy for analog and mixed-signal integrated circuits.Karim Arabi, Bozena Kaminska
1996VTSA new digital test approach for analog-to-digital converter testing.Mehdi Ehsanian, Bozena Kaminska, Karim Arabi
1995ISCASAn Offset Compensated CMOS Current-Feedback Operational-Amplifier.Jieyan Zhu, Mohamad Sawan, Karim Arabi
1994ICCADA new built-in self-test approach for digital-to-analog and analog-to-digital converters.Karim Arabi, Bozena Kaminska, Janusz Rzeszut