| 2010 | ITC | Commanded Test Access Port operations. | Lee Whetsel |
| 2006 | ITC | A High Speed Reduced Pin Count JTAG Interface. | Lee Whetsel |
| 2003 | ITC | Overview of the IEEE P1500 Standard. | Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur |
| 2003 | ITC | Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices. | Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel |
| 2003 | ITC | Adapting JTAG for AC Interconnect Testing. | Lee Whetsel |
| 2002 | ITC | Inevitable Use of TAP Domains in SOCs. | Lee Whetsel |
| 2001 | ITC | An analysis of power reduction techniques in scan testing. | Jayashree Saxena, Kenneth M. Butler, Lee Whetsel |
| 2000 | ITC | Adapting scan architectures for low power operation. | Lee Whetsel |
| 1999 | ITC | Addressable test ports an approach to testing embedded cores. | Lee Whetsel |
| 1999 | ITC | Towards a standard for embedded core test: an example. | Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel |
| 1998 | ITC | Core test connectivity, communication, and control. | Lee Whetsel |
| 1997 | ITC | An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores. | Lee Whetsel |
| 1997 | ITC | Test Access of TAP'ed & Non-TAP'ed Cores. | Lee Whetsel |
| 1996 | ITC | Proposal to Simplify Development of a Mixed-Signal Test Standard. | Lee Whetsel |
| 1995 | ITC | Improved Boundary Scan Design. | Lee Whetsel |
| 1994 | ITC | An Approach to Accelerate Scan Testing in IEEE 1149.1 Architectures. | Lee Whetsel |
| 1994 | ITC | Navigating Test Access in Systems. | Lee Whetsel |
| 1993 | ITC | Hierarchically Accessing 1149.1 Applications in a System Environment. | Lee Whetsel |
| 1993 | VTS | An IEEE 1149.1 based voltmeter/oscilloscope in a chip. | Lee Whetsel |
| 1992 | ITC | A Proposed Method of Accessing 1149.1 in a Backplane Environment. | Lee Whetsel |
| 1991 | ITC | An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip. | Lee Whetsel |
| 1990 | ITC | Event qualification: a gateway to at-speed system testing. | Lee Whetsel |
| 1988 | ICCD | A proposed standard test bus and boundary scan architecture. | Lee Whetsel |