Luis Elvira Villagra
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2006–2009
Best venue rank
B
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | ETS | A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits. | Josep Rius, Luis Elvira Villagra, Maurice Meijer |
| 2006 | ITC | Power Supply Noise in Delay Testing. | Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger |