M. Rosales
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
3
Active years
2001–2006
Best venue rank
National
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | VTS | Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?. | Sebasti A. Bota, M. Rosales, Jos Luis Rossell, Jaume Segura |
| 2005 | DATE | Smart Temperature Sensor for Thermal Testing of Cell-Based ICs. | Sebasti A. Bota, M. Rosales, Jos Luis Rossell, Jaume Segura |
| 2004 | ITC | Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism. | Sebasti A. Bota, M. Rosales, Jos Luis Rossell, Jaume Segura, Ali Keshavarzi |
| 2002 | ITC | Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. | Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura |
| 2001 | VTS | Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. | Ivan de Pal, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden |