Masaru Sanada
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1996–2000
Best venue rank
B
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2000 | ETS | Defect detection from visual abnormalities in manufacturing process using I | Masaru Sanada |
| 1996 | VTS | A CAD-based approach to failure diagnosis of CMOS LSI's using abnormal Iddq. | Masaru Sanada |