Matthew Nigh
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
4
Active years
2022–2026
Best venue rank
National
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | VTS | WALET: SHAP-Guided Classification of Wafer-Level E-Test Variability for Early Manufacturing Risk Detection. | Ching-Yi Chang, Matthew Nigh, John M. Carulli, Yiorgos Makris |
| 2025 | ICCAD | Unveiling the Mask: Trusted Semiconductor Manufacturing through Wafer-Level Mask-Set Attestation. | Suraag Sunil Tellakula, Ching-Yi Chang, Matthew Nigh, Christos Vasileiou, John M. Carulli, Yiorgos Makris |
| 2025 | VTS | Enhancing Metrology to E-test Correlation Model Accuracy through Process Expertise Integration. | Ching-Yi Chang, Matthew Nigh, John M. Carulli, Yiorgos Makris |
| 2024 | ITC | Generation and Quality Evaluation of Synthetic Process Control Monitoring Data. | Matthew Nigh, John M. Carulli, Yiorgos Makris |
| 2022 | ICIP | Efficient CNN-Based Super Resolution Algorithms for Mmwave Mobile Radar Imaging. | Christos Vasileiou, Josiah W. Smith, Shiva Thiagarajan, Matthew Nigh, Yiorgos Makris, Murat Torlak |