Michael Pas
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
6
Venues
4
Active years
2015–2016
Best venue rank
A
Where they publish
Papers
6 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | ICCAD | A machine learning approach to fab-of-origin attestation. | Ali Ahmadi, Mohammad-Mahdi Bidmeshki, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2016 | ISCAS | Harnessing fabrication process signature for predicting yield across designs. | Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2016 | ITC | Harnessing process variations for optimizing wafer-level probe-test flow. | Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2016 | VTS | Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. | Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2015 | ICCAD | Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. | Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris |
| 2015 | VTS | Yield prognosis for fab-to-fab product migration. | Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris |