| 2016 | VTS | Special panel session IIB: "System validation and silicon debug - Is standardization possible?". | Mike Ricchetti, Eric Rentschler, Amit Majumdar, Mike Lowe, Mark LaVine, Skip Lindsey, Sharad Kumar |
| 2015 | VTS | Innovative practices session 3C: Advances in silicon debug & diagnosis. | Mike Ricchetti |
| 2006 | ITC | IEEE P1687: Toward Standardized Access of Embedded Instrumentation. | Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote |
| 2004 | ITC | A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems. | C. J. Clark, Mike Ricchetti |
| 2003 | ITC | IEEE 1149.6 - A Practical Perspective. | Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz |
| 2002 | VTS | Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer? | Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark |
| 2001 | VTS | IP and Automation to Support IEEE P1500. | Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti |
| 1998 | ITC | Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard. | Bulent I. Dervisoglu, Mike Ricchetti, William Eklow |
| 1988 | ITC | Scan Diagnostic Strategy for the Series 10000 Prism Workstation. | Mike Ricchetti, John Hoglund |