| 2013 | ITC | PADRE: Physically-Aware Diagnostic Resolution Enhancement. | Yang Xue, Osei Poku, Xin Li, Ronald D. Blanton |
| 2012 | DAC | Test-data volume optimization for diagnosis. | Hongfei Wang, Osei Poku, Xiaochun Yu, Sizhe Liu, Ibrahima Komara, Ronald D. Blanton |
| 2010 | ITC | Systematic defect identification through layout snippet clustering. | Wing Chiu Tam, Osei Poku, Ronald D. Blanton |
| 2009 | DAC | Automated failure population creation for validating integrated circuit diagnosis methods. | Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton |
| 2009 | VTS | Controlling DPPM through Volume Diagnosis. | Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton |
| 2008 | DAC | Precise failure localization using automated layout analysis of diagnosis candidates. | Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton |
| 2008 | DATE | Physically-Aware N-Detect Test Pattern Selection. | Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton |
| 2008 | ITC | Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. | Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar |
| 2007 | ITC | Delay defect diagnosis using segment network faults. | Osei Poku, Ronald D. Blanton |
| 2006 | ITC | A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior. | Rao Desineni, Osei Poku, Ronald D. Blanton |