Pete O'Neill
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
2
Active years
1999–2002
Best venue rank
A
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2002 | ITC | Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. | Minh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill |
| 2001 | VTS | Reliability Beyond GHz. | Pete O'Neill, Ron Richmond, Mike Tripp, Barbara Vasquez, Art Wager, Zeev Weinberg |
| 2000 | ITC | Current ratios: a self-scaling technique for production IDDQ testing. | Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman |
| 1999 | ITC | Current ratios: a self-scaling technique for production I_DDQ testing. | Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman |