Pieter Weckx
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
16
Venues
6
Active years
2012–2024
Best venue rank
A
Where they publish
Papers
16 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2024 | ETS | Silent Data Corruption: Test or Reliability Problem? | Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen |
| 2023 | DATE | Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level. | Behnaz Ranjbar, Florian Klemme, Paul R. Genssler, Hussam Amrouch, Jinhyo Jung, Shail Dave, Hwisoo So, Kyongwoo Lee, Aviral Shrivastava, Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Francky Catthoor, Dwaipayan Biswas, Akash Kumar |
| 2023 | ISCAS | Impact of interconnects enhancement on SRAM design beyond 5nm technology node. | Mohit Kumar Gupta, Pieter Weckx, Manu Perumkunnil Komalan, Julien Ryckaert |
| 2022 | DATE | Proactive Run-Time Mitigation for Time-Critical Applications Using Dynamic Scenario Methodology. | Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Alessio Spessot, Francky Catthoor |
| 2022 | DATE | Design enablement of CFET devices for sub-2nm CMOS nodes. | Odysseas Zografos, Bilal Chehab, Pieter Schuddinck, Gioele Mirabelli, Naveen Kakarla, Yang Xiang, Pieter Weckx, Julien Ryckaert |
| 2020 | DATE | Mitigation of Sense Amplifier Degradation Using Skewed Design. | Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2019 | DATE | Methodology for Application-Dependent Degradation Analysis of Memory Timing. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2019 | ETS | Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2018 | DATE | Degradation analysis of high performance 14nm FinFET SRAM. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor |
| 2018 | ETS | Device aging: A reliability and security concern. | Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi |
| 2017 | DATE | Mitigation of sense amplifier degradation using input switching. | Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene |
| 2016 | DDECS | Comparative BTI analysis for various sense amplifier designs. | Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor |
| 2016 | ETS | Read path degradation analysis in SRAM. | Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene |
| 2015 | VTS | Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. | Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor |
| 2014 | DSD | NBTI Aging on 32-Bit Adders in the Downscaling Planar FET Technology Nodes. | Halil Kukner, Pieter Weckx, Sebastien Morrison, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken |
| 2012 | DSD | Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model. | Halil Kukner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken |