| 2001 | ITC | Bitline contacts in high density SRAMs: design for testability and stressability. | Harold Pilo, R. Dean Adams, Robert E. Busch, Eric A. Nelson, Geoerge E. Rudgers |
| 2000 | ITC | Self test architecture for testing complex memory structures. | Kamran Zarrineh, R. Dean Adams, Thomas J. Eckenrode, Steven P. Gregor |
| 2000 | VTS | Silicon-on-Insulator Technology Impacts on SRAM Testing. | R. Dean Adams, Phil Shephard III |
| 1999 | VTS | The Limits of Digital Testing for Dynamic Circuits. | R. Dean Adams, Edmond S. Cooley |
| 1998 | ITC | Quad DCVS dynamic logic fault modeling and testing. | R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen |
| 1997 | ITC | A Self-Test Circuit for Evaluating Memory Sense-Amplifier Signal. | R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen |
| 1995 | DATE | A 370-MHz memory built-in self-test state machine. | R. Dean Adams, John Connor, Garret S. Koch, Luigi Ternullo Jr. |
| 1995 | ITC | Deterministic Self-Test of a High-Speed Embedded Memory and Logic Processor Subsystem. | Luigi Ternullo Jr., R. Dean Adams, John Connor, Garret S. Koch |