Rafic Z. Makki
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
6
Venues
3
Active years
1986–2002
Best venue rank
A
Where they publish
Papers
6 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2002 | DATE | I | Suriya Ashok Kumar, Rafic Z. Makki, David M. Binkley |
| 1995 | ITC | Transient Power Supply Current Testing of Digital CMOS Circuits. | Rafic Z. Makki, Shyang-Tai Su, H. Troy Nagle |
| 1992 | VTS | A testable static RAM structure for efficient coverage of pattern sensitive faults. | Shyang-Tai Su, Rafic Z. Makki |
| 1991 | ITC | On the Integration of Design and Manufacturing for Improved Testability. | Rafic Z. Makki, Kasra Daneshvar, Farid Tranjan, Richard Greene |
| 1990 | ITC | Practical partitioning for testability with time-shared boundary scan. | Rafic Z. Makki, Krisbnm Palaniswami |
| 1986 | ITC | Designing Testable Control Paths with Multiple and Feedback Scan-Paths. | Rafic Z. Makki, C. Tiansheng |