Randall Rooney
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2001–2001
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2001 | ITC | Pseudo fail bit map generation for RAMs during component test and burn-in in a manufacturing environment. | Jrg E. Vollrath, Randall Rooney |