Rao Desineni
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
9
Venues
4
Active years
2000–2016
Best venue rank
A*
Where they publish
Papers
9 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | ITC | Pylon: Towards an integrated customizable volume diagnosis infrastructure. | Yan Pan, Rao Desineni, Kannan Sekar, Atul Chittora, Sherwin Fernandes, Neerja Bawaskar, John M. Carulli |
| 2010 | ITC | Hard to find, easy to find systematics; just find them. | Rao Desineni, Leah Pastel, Maroun Kassab, Robert Redburn |
| 2006 | DAC | Multiple-detect ATPG based on physical neighborhoods. | Jeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton |
| 2006 | DATE | Extraction of defect density and size distributions from wafer sort test results. | Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton |
| 2006 | ITC | A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior. | Rao Desineni, Osei Poku, Ronald D. Blanton |
| 2005 | VTS | Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction. | Rao Desineni, R. D. (Shawn) Blanton |
| 2004 | ITC | Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. | Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary |
| 2002 | ITC | Fault Tuples in Diagnosis of Deep-Submicron Circuits. | Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels |
| 2000 | ITC | Universal test generation using fault tuples. | Rao Desineni, Kumar N. Dwarakanath, Ronald D. Blanton |