| 2025 | ITC | Wafer Map Pattern Recognition for Multisite Probe with Synthetic Data Augmented Training. | Chen He, Rebecca Chen, Patrick Goertz |
| 2025 | ITC | Transfer Learning for Minimum Operating Voltage Prediction in Advanced Technology Nodes: Leveraging Legacy Data and Silicon Odometer Sensing. | Yuxuan Yin, Rebecca Chen, Boxun Xu, Chen He, Peng Li |
| 2025 | VTS | Data-Efficient Prediction of Minimum Operating Voltage via Inter- and Intra-Wafer Variation Alignment. | Yuxuan Yin, Rebecca Chen, Chen He, Peng Li |
| 2025 | VTS | Reliable Board-Level Degradation Prediction with Monotonic Segmented Regression under Noisy Measurement. | Yuxuan Yin, Rebecca Chen, Varun Thukral, Chen He, Peng Li |
| 2024 | DAC | Data-Efficient Conformalized Interval Prediction of Minimum Operating Voltage Capturing Process Variations. | Yuxuan Yin, Rebecca Chen, Chen He, Peng Li |
| 2024 | DATE | Reliable Interval Prediction of Minimum Operating Voltage Based on On-Chip Monitors via Conformalized Quantile Regression. | Yuxuan Yin, Xiaoxiao Wang, Rebecca Chen, Chen He, Peng Li |
| 2024 | ITC | AI-Enabled Board Level Vibration Testing: Unveiling The Physics of Degradation. | Varun Thukral, Chen He, Rebecca Chen, Letian Zhang, Romuald Roucou, Michiel van Soestbergen, Jeroen J. M. Zaal, Rene Rongen, Willem D. van Driel, G. Q. Zhang |
| 2023 | ITC | Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction Using On-Chip Monitor Data. | Yuxuan Yin, Rebecca Chen, Chen He, Peng Li |
| 2019 | CISS | Registration for Image-Based Transcriptomics: Parametric Signal Features and Multivariate Information Measures. | Rebecca Chen, Abhinav B. Das, Lav R. Varshney |
| 2011 | APNOMS | When social networking meets the next generation network. | Rebecca Chen, Jui-Ming Chen, Meng-Hsun Tsai, Sih-Han Wang, Shu-Shan Ku, Jen-Huei Jung, Jeu-Yih Jeng |