Rene Krenz-Baath
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
14
Venues
5
Active years
2007–2023
Best venue rank
A
Where they publish
Papers
14 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2023 | DDECS | Verifying Bio-Electronic Systems. | Joseline Heuer, Rene Krenz-Baath, Roman Obermaisser |
| 2017 | DATE | BASTION: Board and SoC test instrumentation for ageing and no failure found. | Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke |
| 2016 | ITC | A suite of IEEE 1687 benchmark networks. | Anton Tsertov, Artur Jutman, Sergei Devadze, Matteo Sonza Reorda, Erik Larsson, Farrokh Ghani Zadegan, Riccardo Cantoro, Mehrdad Montazeri, Rene Krenz-Baath |
| 2016 | ITC | Upper-bound computation for optimal retargeting in IEEE1687 networks. | Farrokh Ghani Zadegan, Rene Krenz-Baath, Erik Larsson |
| 2015 | ITC | Access time minimization in IEEE 1687 networks. | Rene Krenz-Baath, Farrokh Ghani Zadegan, Erik Larsson |
| 2014 | ETS | Optimization-based multiple target test generation for highly compacted test sets. | Stephan Eggersgl, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler |
| 2013 | DDECS | Fault collapsing of multi-conditional faults. | Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke |
| 2013 | DSD | Industrial Application of IEEE P1687 for an Automotive Product. | Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath |
| 2012 | DDECS | A new SAT-based ATPG for generating highly compacted test sets. | Stephan Eggersgl, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler |
| 2012 | DSD | Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. | Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz |
| 2010 | ETS | Improving CNF representations in SAT-based ATPG for industrial circuits using BDDs. | Daniel Tille, Stephan Eggersgl, Rene Krenz-Baath, Jrgen Schlffel, Rolf Drechsler |
| 2010 | ITC | Defect-oriented cell-internal testing. | Friedrich Hapke, Wilfried Redemund, Jrgen Schlffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger |
| 2009 | ITC | Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. | Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jrgen Schlffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson |
| 2007 | ETS | Computation and Application of Absolute Dominators in Industrial Designs. | Rene Krenz-Baath, Andreas Glowatz, Jrgen Schlffel |