Riccardo Miglierina
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2016–2016
Best venue rank
B
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | ETS | Measuring defect tolerance within mixed-signal ICs. | Stephen Sunter, Alessandro Valerio, Riccardo Miglierina |
| 2016 | ITC | Automated measurement of defect tolerance in mixed-signal ICs. | Stephen Sunter, Alessandro Valerio, Riccardo Miglierina |