Richard F. Herlein
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
1
Active years
1983–2005
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2005 | ITC | Diagnosis and analysis of an analog circuit failure using time resolved emission microscopy. | Ahmed Syed, Richard F. Herlein, Ben Cain, Frank Sauk |
| 1993 | ITC | Terminating Transmission lines in the Test Environment. | Richard F. Herlein |
| 1983 | ITC | Optimizing the Timing Architecture of a Digital LSI Test System. | Richard F. Herlein |