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Richard Morren

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

6

Venues

2

Active years

1992–2013

Best venue rank

A

Where they publish

Papers

6 indexed papers, newest first.

YearVenueTitleAuthors
2013DSDIndustrial Application of IEEE P1687 for an Automotive Product.Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath
2010ITCClock control architecture and ATPG for reducing pattern count in SoC designs with multiple clock domains.Tom Waayers, Richard Morren, Xijiang Lin, Mark Kassab
2005ITCDefinition of a robust modular SOC test architecture; resurrection of the single TAM daisy-chain.Tom Waayers, Richard Morren, Roberto Grandi
1993ITCMix Test: A Mixed-Signal Extension to a Digital Test System.R. Mehtani, Bert Atzema, M. De Jonghe, Richard Morren, Geert Seuren, Taco Zwemstra
1992ITCImproving Total IC Design Quality Using Application Mode Testing.R. Mehtani, M. De Jonghe, Richard Morren, Keith Baker
1992ITCUsing EDIF for Transfer of Test Data: Practical Experience.Bas Verhelst, Richard Morren, Keith Baker