Ritesh P. Turakhia
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
2
Active years
2004–2009
Best venue rank
National
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | VTS | Effective and Efficient Test Pattern Generation for Small Delay Defect. | Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia |
| 2009 | VTS | Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. | Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware |
| 2007 | ITC | Silicon evaluation of longest path avoidance testing for small delay defects. | Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke |
| 2005 | VTS | Defect Screening Using Independent Component Analysis on I_DDQ. | Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch |
| 2004 | ITC | In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. | Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler |