| 2007 | DAC | Making Manufacturing Work For You. | Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian |
| 2005 | ITC | Variance reduction and outliers: statistical analysis of semiconductor test data. | W. Robert Daasch, Robert Madge |
| 2005 | ITC | Data-driven models for statistical testing: measurements, estimates and residuals. | W. Robert Daasch, Robert Madge |
| 2005 | ITC | The value of statistical testing for quality, yield and test cost improvement. | Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch |
| 2005 | ITC | Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. | Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware |
| 2005 | VTS | Defect Screening Using Independent Component Analysis on I_DDQ. | Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch |
| 2004 | ITC | Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. | Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski |
| 2004 | ITC | New Test Paradigms for Yield and Manufacturability. | Robert Madge |
| 2004 | ITC | ATE Value Add through Open Data Collection. | Robert Madge |
| 2004 | ITC | In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. | Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler |
| 2004 | ITC | ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. | Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw |
| 2004 | VTS | Detection of Temperature Sensitive Defects Using ZTC. | Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware |
| 2003 | DATE | Creating Value Through Test. | Erik Jan Marinissen, Bart Vermeulen, Robert Madge, Michael Kessler, Michael Mller |
| 2003 | ITC | Impact of Multiple-Detect Test Patterns on Product Quality. | Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski |
| 2003 | ITC | Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. | Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning |
| 2003 | VTS | Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. | Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch |
| 2002 | ITC | Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. | W. Robert Daasch, Kevin Cota, James McNames, Robert Madge |
| 2002 | ITC | Screening MinVDD Outliers Using Feed-Forward Voltage Testing. | Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner |
| 2002 | ITC | Isolating and Removing Sources of Variation in Test Data. | David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge |
| 2002 | VTS | Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. | Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch |
| 2001 | ITC | Neighbor selection for variance reduction in I_DDQ and other parametric data. | W. Robert Daasch, Kevin Cota, James McNames, Robert Madge |