Rodger Schuttert
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
2
Active years
1998–2005
Best venue rank
A
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2005 | ITC | Power-scan chain: design for analog testability. | Amir Zjajo, Henk Jan Bergveld, Rodger Schuttert, Jos Pineda de Gyvez |
| 2004 | ITC | On-Chip Mixed-Signal Test Structures Re-used for Board Test. | Rodger Schuttert, D. C. L. (Erik) van Geest, A. Kumar |
| 2002 | VTS | Improved Test Monitor Circuit in Power Pin DfT. | Rodger Schuttert, Frans G. M. de Jong, Ben Kup |
| 2000 | ITC | Power pin testing: making the test coverage complete. | Frans G. M. de Jong, Ben Kup, Rodger Schuttert |
| 1998 | ITC | Testing a multichip package for a consumer communications application. | Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer |