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Ron G. Walther

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

4

Venues

3

Active years

1982–1997

Best venue rank

A*

Where they publish

Papers

4 indexed papers, newest first.

YearVenueTitleAuthors
1997VTSMicroprocessor Test and Validation: Any New Avenues?Magdy S. Abadir, Jacob A. Abraham, Hong Hao, C. Hunter, Wayne M. Needham, Ron G. Walther
1994DACMicroprocessor Testing: Which Technique is Best? (Panel).Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther
1984DACChip partitioning aid: A design technique for partitionability and testability in VLSI.Subrata Dasgupta, M. C. Graf, Robert A. Rasmussen, Ron G. Walther, Tom W. Williams
1982ITCA Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI.Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams