Samir B. Naik
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1989–1993
Best venue rank
National
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1993 | VTS | Computer-aided failure analysis of VLSI circuits using I | Samir B. Naik, Wojciech P. Maly |
| 1989 | ITC | Process Monitoring Oriented IC Testing. | Wojciech Maly, Samir B. Naik |