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Shreyas Nandi

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

2

Venues

2

Active years

2020–2021

Best venue rank

National

Where they publish

Papers

2 indexed papers, newest first.

YearVenueTitleAuthors
2021VTSTwo Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts.Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee
2020ITCSAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts.Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee