Shyang-Tai Su
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1992–1995
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1995 | ITC | Transient Power Supply Current Testing of Digital CMOS Circuits. | Rafic Z. Makki, Shyang-Tai Su, H. Troy Nagle |
| 1992 | VTS | A testable static RAM structure for efficient coverage of pattern sensitive faults. | Shyang-Tai Su, Rafic Z. Makki |