Steve Comen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2007–2014
Best venue rank
National
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2014 | VTS | Innovative practices session 7C: Reduced pin-count testing - How low can we go? | Stephen K. Sunter, Steve Comen, Paul Berndt, Ram Rajamani |
| 2007 | ITC | Where is car IC testing going? | Steve Comen |