Sunghoon Chun
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
3
Active years
2003–2009
Best venue rank
National
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | VTS | A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections. | Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang |
| 2008 | ASPDAC | A new low energy BIST using a statistical code. | Sunghoon Chun, Taejin Kim, Sungho Kang |
| 2008 | ITC | A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. | Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang |
| 2008 | VTS | An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. | Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang |
| 2003 | ITC | A New Maximal Diagnosis Algorithm for Bus-structured Systems. | YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang |