| 2008 | CIT | A Novel Technique for Input Vector Compression in System-on-Chip Testing. | Satyendra N. Biswas, Sunil R. Das, Mansour H. Assaf |
| 2004 | CIT | Implementation of Embedded Cores-Based Digital Devices in JBits Java Simulation Environment. | Mansour H. Assaf, Rami S. Abielmona, Payam Abolghasem, Sunil R. Das, Emil M. Petriu, Voicu Groza, Mehmet Sahinoglu |
| 2001 | VLSID | An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers. | Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das |
| 2001 | VLSID | A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers. | Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das |
| 1998 | CATA | Pseudorandom encoding for structured light applications. | Emil M. Petriu, Sunil R. Das, Niculaie Trif, Stephen S. K. Yeung |
| 1998 | VLSID | A Stochastic Method for Defect Level Analysis of Pseudorandom Testing. | Wen-Ben Jone, Sunil R. Das |
| 1997 | VLSID | Delay Fault Coverage Enhancement Using Multiple Test Observation Times. | Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das |
| 1996 | VLSID | Syndrome signature in output compaction for VLSI BIST. | Sunil R. Das, Nishith Goel, Wen-Ben Jone, Amiya R. Nayak |
| 1995 | VLSID | An improved output compaction technique for built-in self-test in VLSI circuits. | Sunil R. Das, H. T. Ho, Wen-Ben Jone, Amiya R. Nayak |
| 1994 | ICPADS | Designing General-Purpose Fault-Tolerant Distributed Systems - A Layered Approach. | Amiya R. Nayak, Wen-Ben Jone, Sunil R. Das |
| 1994 | VLSID | On Probabilistic Testing of Large-Scale Sequential Circuits Using Circuit Decomposition. | Sunil R. Das, Wen-Ben Jone, Amiya Nayak, Ian Choi |
| 1993 | VLSID | CACOP - A Random Pattern Testability Analyzer. | Wen-Ben Jone, Sunil R. Das |
| 1990 | MICRO | A survey on bit dimension optimization strategies of microprograms. | Sunil R. Das, Amiya Nayak |