Taizhi Liu
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
3
Active years
2014–2018
Best venue rank
National
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2018 | VTS | Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology. | Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor |
| 2017 | IOLTS | On-line monitoring of system health using on-chip SRAMs as a wearout sensor. | Woongrae Kim, Taizhi Liu, Linda Milor |
| 2016 | ICCD | SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection. | Taizhi Liu, Chang-Chih Chen, Jiadong Wu, Linda S. Milor |
| 2014 | VTS | Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. | Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor |