Takahisa Hiraide
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
3
Active years
2003–2006
Best venue rank
B
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | ASPDAC | Delay defect screening for a 2.16GHz SPARC64 microprocessor. | Noriyuki Ito, Akira Kanuma, Daisuke Maruyama, Hitoshi Yamanaka, Tsuyoshi Mochizuki, Osamu Sugawara, Chihiro Endoh, Masahiro Yanagida, Takeshi Kono, Yutaka Isoda, Kazunobu Adachi, Takahisa Hiraide, Shigeru Nagasawa, Yaroku Sugiyama, Eizo Ninoi |
| 2006 | ITC | Test Data Compression of 100x for Scan-Based BIST. | Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo |
| 2003 | VTS | BIST-Aided Scan Test - A New Method for Test Cost Reduction. | Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama |