Thomas Droniou
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
2
Active years
2008–2015
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2015 | VTS | Horizontal-FPN fault coverage improvement in production test of CMOS imagers. | Richun Fei, Jocelyn Moreau, Salvador Mir, Alexis Marcellin, C. Mandier, E. Huss, G. Palmigiani, P. Vitrou, Thomas Droniou |
| 2009 | ITC | Running scan test on three pins: yes we can! | Jocelyn Moreau, Thomas Droniou, Philippe Lebourg, Paul Armagnat |
| 2008 | ITC | High Test Quality in Low Pin Count Applications. | Jayant D'Souza, Subramanian Mahadevan, Nilanjan Mukherjee, Graham Rhodes, Jocelyn Moreau, Thomas Droniou, Paul Armagnat, Damien Sartoretti |