Skip to content

Thomas S. Barnett

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

5

Venues

2

Active years

2001–2003

Best venue rank

A

Where they publish

Papers

5 indexed papers, newest first.

YearVenueTitleAuthors
2003ITCRelating Yield Models to Burn-In Fall-Out in Time.Thomas S. Barnett, Adit D. Singh
2002ITCRedundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model.Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh
2002VTSYield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction.Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy
2001ITCEstimating burn-in fall-out for redundant memory.Thomas S. Barnett, Adit D. Singh, Victor P. Nelson
2001VTSBurn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model.Thomas S. Barnett, Adit D. Singh, Victor P. Nelson