Thomas Zanon
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
3
Active years
2003–2009
Best venue rank
A
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | VTS | STDF Memory Fail Datalog Standard. | Ajay Khoche, Jay Katz, Sauro Landini, Kochen Liao, Neetu Agrawal, Glenn Plowman, Songlin Zuo, Liyang Lai, John Rowe, Thomas Zanon |
| 2006 | DATE | Extraction of defect density and size distributions from wafer sort test results. | Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton |
| 2004 | ITC | Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. | Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary |
| 2003 | ITC | Deformations of IC Structure in Test and Yield Learning. | Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey |