Tino Heijmen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
2
Active years
2005–2008
Best venue rank
C
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | IOLTS | Special Session 3 - Panel: SER in Automotive: what is the impact of the AEC Q100-G spec? | Tino Heijmen |
| 2008 | IOLTS | Soft-Error Vulnerability of Sub-100-nm Flip-Flops. | Tino Heijmen |
| 2007 | IOLTS | Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs. | Tino Heijmen |
| 2006 | ETS | Soft-Error Rate Testing of Deep-Submicron Integrated Circuits. | Tino Heijmen, Andr Nieuwland |
| 2006 | IOLTS | Soft Error Rates in Deep-Submicron CMOS Technologies. | Tino Heijmen |
| 2006 | IOLTS | Factors That Impact the Critical Charge of Memory Elements. | Tino Heijmen, Damien Giot, Philippe Roche |
| 2005 | IOLTS | Analytical Semi-Empirical Model for SER Sensitivity Estimation of Deep-Submicron CMOS Circuits. | Tino Heijmen |