Toshinobu Ono
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1991–1994
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1994 | ICCAD | Selecting partial scan flip-flops for circuit partitioning. | Toshinobu Ono |
| 1991 | ITC | A Test Generation Method for Sequential Circuits Based on Maximum Utilization of Internal States. | Toshinobu Ono, Masaaki Yoshida |